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EVS-EN ISO 16526-1:2020

Non-destructive testing - Measurement and evaluation of the X-ray tube voltage - Part 1: Voltage divider method (ISO 16526-1:2011)

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Kehtiv alates 19.03.2020
Alusdokumendid
ISO 16526-1:2011; EN ISO 16526-1:2020
Tegevusala (ICS grupid)
19.100 Mittepurustav katsetamine
Direktiivid või määrused
puuduvad

Standardi ajalugu

Staatus
Kuupäev
Tüüp
Nimetus
19.03.2020
Põhitekst
01.07.2001
Põhitekst
01.07.2001
Põhitekst
01.09.2000
Põhitekst
ISO 16526-1:2011 specifies a method for the direct and absolute measurement of the average high voltage of constant potential (DC) X-ray systems on the secondary side of the high voltage generator. The intention is to check the correspondence with the indicated high voltage value on the control unit of the X-ray system.
This method is applied to assure a reproducible operation of X-ray systems because the voltage influences particularly the penetration of materials and the contrast of X-ray images and also the requirements concerning the radiation protection.

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