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EVS-EN 12544-2:2000

Non-destructive testing - Measurement and evaluation of the X-ray tube voltage - Part 2: Constancy check by the thick filter method

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Kehtetu alates 19.03.2020
Alusdokumendid
EN 12544-2:2000
Tegevusala (ICS grupid)
19.100 Mittepurustav katsetamine
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Standardi ajalugu

Staatus
Kuupäev
Tüüp
Nimetus
19.03.2020
Põhitekst
19.03.2020
Põhitekst
01.09.2000
Põhitekst
This standard describes a constancy check of a X-ray system, where mainly the X-ray voltage is checked and also the tube current and the constitution of the target which may be changing due to ageing of the tube. The thick filter method is based on a measurement of the dose rate behind a defined thich filter using defined distances between the X-ray tube, the filter and the measuring device.

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