EVS-EN 61000-4-20:2010

This part of IEC 61000 relates to emission and immunity test methods for electrical and electronic equipment using various types of transverse electromagnetic (TEM) waveguides. These types include open structures (for example, striplines and electromagnetic pulse simulators) and closed structures (for example, TEM cells). These structures can be further classified as one-, two-, or multi-port TEM waveguides. The frequency range depends on the specific testing requirements and the specific TEM waveguide type. The object of this standard is to describe - TEM waveguide characteristics, including typical frequency ranges and EUT-size limitations; - TEM waveguide validation methods for EMC tests; - the EUT (i.e. EUT cabinet and cabling) definition; - test set-ups, procedures, and requirements for radiated emission testing in TEM waveguides and - test set-ups, procedures, and requirements for radiated immunity testing in TEM waveguides.