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ISO 10110-7:2008

Optics and photonics -- Preparation of drawings for optical elements and systems -- Part 7: Surface imperfection tolerances

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Kehtetu alates 16.08.2017
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Staatus
Kuupäev
Tüüp
Nimetus
16.08.2017
Põhitekst
11.02.2008
Põhitekst
07.03.1996
Põhitekst
ISO 10110-7:1996
ISO 10110-7:2008 specifies the indication of the level of acceptability of surface imperfections within the effective aperture of individual optical elements and optical assemblies. These include localized surface imperfections, edge chips and long scratches.
ISO 10110-7:2008 applies to transmitting and reflecting surfaces of finished optical elements, whether or not they are coated, and to optical assemblies. It recognizes that permissible imperfections may be specified according to the area affected by imperfections on components or in optical assemblies.

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