Skip to main content
Tagasi

IEC 60749-5:2017

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

Üldinfo

Kehtetu alates 19.12.2023
Direktiivid või määrused
puuduvad

Standardi ajalugu

Staatus
Kuupäev
Tüüp
Nimetus
19.12.2023
Põhitekst
10.04.2017
Põhitekst
Põhitekst
IEC 60749-5:2003
IEC 60749-5:2017(E) provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
This second edition cancels and replaces the first edition published in 2003. This edition constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous edition:
a)   correction of an error in an equation;
b)   inclusion of notes for guidance;
c)   clarification of the applicability of test conditions.

Nõutud väljad on tähistatud *

*
*
*
PDF
52,45 € koos KM-ga
Paber
52,45 € koos KM-ga
Standardi monitooring