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EVS-EN ISO 12179:2022

Geometrical product specifications (GPS) - Surface texture: Profile method - Calibration of contact (stylus) instruments (ISO 12179:2021)

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Kehtiv alates 01.02.2022
Alusdokumendid
ISO 12179:2021; EN ISO 12179:2022
Tegevusala (ICS grupid)
17.040.30 Mõõtevahendid
Direktiivid või määrused
puuduvad

Standardi ajalugu

Staatus
Kuupäev
Tüüp
Nimetus
01.02.2022
Põhitekst
07.11.2008
Parandus
01.10.2000
Põhitekst
This document specifies the calibration and adjustment of the metrological characteristics of contact (stylus) instruments for the measurement of surface texture by the profile method as defined in ISO 3274. The calibration and adjustment is intended to be carried out with the aid of measurement standards.
Annex B specifies the calibration and adjustment of metrological characteristics of simplified operator contact (stylus) instruments which do not conform with ISO 3274.

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