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EVS-EN 62435-2:2017

Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms

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Kehtiv alates 16.05.2017
Alusdokumendid
IEC 62435-2:2017; EN 62435-2:2017
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Nimetus
16.05.2017
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IEC 62435-2:2017 is related to deterioration mechanisms and is concerned with the way that components degrade over time depending on the storage conditions applied. This part also includes guidance on test methods that may be used to assess generic deterioration mechanisms. Typically, this part is used in conjunction with IEC 62435-1:2017 for any device long-term storage whose duration may be more than 12 months for product scheduled for long duration storage.

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EVS-EN 62435-1:2017

Electronic components - Long-term storage of electronic semiconductor devices - Part 1: General
Uusim versioon Kehtiv alates 16.05.2017
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EVS-EN IEC 62435-6:2018

Electronic components - Long-term storage of electronic semiconductor devices - Part 6: Packaged or Finished Devices
Uusim versioon Kehtiv alates 02.11.2018
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EVS-EN IEC 62435-3:2020

Electronic components - Long-term storage of electronic semiconductor devices - Part 3: Data
Uusim versioon Kehtiv alates 04.05.2020
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EVS-EN IEC 62435-4:2018

Electronic components - Long-term storage of electronic semiconductor devices - Part 4: Storage
Uusim versioon Kehtiv alates 04.09.2018