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EVS-EN 60749-5:2017

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

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Kehtetu alates 01.02.2024
Alusdokumendid
IEC 60749-5:2017; EN 60749-5:2017
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Standardi ajalugu

Staatus
Kuupäev
Tüüp
Nimetus
01.02.2024
Põhitekst
17.07.2017
Põhitekst
01.07.2003
Põhitekst
EVS-EN 60749-5:2003
IEC 60749-5:2017(E) provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
This second edition cancels and replaces the first edition published in 2003. This edition constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous edition:
a) correction of an error in an equation;
b) inclusion of notes for guidance;
c) clarification of the applicability of test conditions.

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