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EVS-EN 60749:2002

Semiconductor devices - Mechanical and climatic test methods

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Kehtetu alates 06.10.2003
Alusdokumendid
IEC 60749:1996+A1:2000+A2:2001; EN 60749:1999+A1:2000+A2:2001
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Kuupäev
Tüüp
Nimetus
07.11.2003
Põhitekst
Põhitekst
This International Standard lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. However, additional test methods may be required for non-cavity devices. This standard has taken into account, wherever possible, IEC 68. The object of this standard is to establish uniform preferred test methods with preferred values for stress levels for judging the environmental properties of semiconductor devices.

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