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EVS-EN 60444-2:2002

Measurement of quartz crystal unit parameters by zero phase technique in a PI-Network - Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units

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Kehtiv alates 01.01.2003
Alusdokumendid
IEC 60444-2:1980; EN 60444-2:1997
Tegevusala (ICS grupid)
31.140 Piesoelektrilised seadised
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Standardi ajalugu

Staatus
Kuupäev
Tüüp
Nimetus
01.01.2003
Põhitekst
This standard describes a method of measuring the motional capacitance of quartz crystal units in the frequency range 1 MHz to 125 MHz with a total measurement error of the order of 5%. The advantage of this method is that it uses only the measuring circuit described in IEC Publication 444 and therefore avoids the use of additional elements or instruments which could be sources of error.

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