Infoteenus
31 ELEKTROONIKA
Uued standardid
IEC 61954:2021/COR1:2024
Corrigendum 1 - Static VAR compensators (SVC) - Testing of thyristor valves
Käsitlusala:
Standardi IEC 61954:2021 parandus
Alusdokumendid:
EVS-EN IEC 61189-2-808:2024
Test methods for electrical materials, printed board and other interconnection structures and assemblies - Part 2-808: Thermal resistance of an assembly by thermal transient method
Käsitlusala:
IEC 61189-2-808:2024 describes the thermal transient method to characterize the thermal resistance of an assembly consisting of a heat source (e.g. power device), an attachment material (e.g. solder) and a dielectric layer with electrode. This method is suitable to determine the thermal resistance of materials and assembly methods as well as to optimize the thermal flux to a heat sink.
NOTE: This method is not intended to measure and specify the value of the thermal resistance of a dielectric material. For that purpose, other standards exist. Examples are given in Annex A.
NOTE: This method is not intended to measure and specify the value of the thermal resistance of a dielectric material. For that purpose, other standards exist. Examples are given in Annex A.
Alusdokumendid:
IEC 61189-2-808:2024; EN IEC 61189-2-808:2024
IEC 62047-48:2024
Semiconductor devices - Micro-electromechanical devices - Part 48: Test method for determining solution concentration by optical absorption using MEMS fluidic device
Käsitlusala:
IEC 62047-48:2024 specifies the requirements and testing method to determine the solution concentration by optical absorption using MEMS fluidic device.
Alusdokumendid: