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IEC 61967-6:2002

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method

General information

Valid from 25.06.2002
Directives or regulations
None

Standard history

Status
Date
Type
Name
30.08.2010
Corrigendum
12.03.2008
Amendment
25.06.2002
Main
Specifies a method for evaluating RF currents on the pins of an integrated circuit (IC) by means of non-contact current measurement using a miniature magnetic probe. This method is capable of measuring the RF currents generated by the IC over a frequency range of 0,15 MHz to 1 000 MHz.

The contents of the corrigendum of August 2010 have been included in this copy.

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Standard monitoring