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IEC 60749-12:2002

Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency

General information

Withdrawn from 13.12.2017
Directives or regulations
None

Standard history

Status
Date
Type
Name
13.12.2017
Main
Describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages.

The contents of the corrigendum of August 2003 have been included in this copy.

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