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IEC 60747-10:1991

Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits

General information

Withdrawn from 23.01.2016
ICS Groups
31.080.01 Semiconductor devices in general 31.200 Integrated circuits. Microelectronics
Directives or regulations
None

Standard history

Status
Date
Type
Name
Main
IEC 60747-10:1991
It is a generic specification for semiconductor devices, discrete
devices and integrated circuits, including multichip integrated
circuits, but excluding hybrid circuits.
It defines general procedures for quality assessment to be used in
the IECQ System and gives general rules for measuring methods of
electrical characteristics, climatic and mechanical tests, and
endurance tests.

Required fields are indicated with *

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Paper
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Standard monitoring
English (PDF 617 KB)

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Standards designation

EVS Estonian standard
EN European standard (published by an CEN or CENELEC)
EN ISO International standard adopted as an European standard
ISO International Organization for Standardization’s standard
IEC International Electrotechnical Commission’s standard
HD CENELEC’s harmonisation document
   
EVS-EN European standard implemented in Estonia
EVS-EN ISO International standard adopted in Europe and implemented in Estonia
EVS-EN ISO/IEC International standard/International electrotechnical standard adopted in Europe and implemented in Estonia
EVS-IEC International electrotechnical standard implemented in Estonia
EVS-ISO International standard implemented in Estonia
   
A, AMD amedment
+A a full standard plus the amendment
/A only amendment
COR, AC corrigendum
+COR a full standard plus the corrigendum
NA national annex
+NA a full standard plus the national annex
/NA only national annex
TS technical specification
TR technical report
CWA agreement, developed by a CEN or CENELEC
prEVS-EN (etc) draft standard
   
et the standard is in Estonian only
en the standard is in English only
et-en the standard is in Parallel text Estonian-English