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EVS-EN ISO 4287:1999/A1:2009

Geometrical Product Specifications (GPS) - Surface texture: Profile method - Terms, definitions and surface texture parameters - Amendment 1: Peak count parameter

General information

Withdrawn from 01.02.2022
Base Documents
ISO 4287:1997/Amd 1:2009; EN ISO 4287:1998/A1:2009
ICS Groups
01.040.17 Metrology and measurement. Physical phenomena (Vocabularies) 17.040.30 Measuring instruments
Directives or regulations
None

Standard history

Status
Date
Type
Name
01.02.2022
Main
EVS-EN ISO 21920-2:2022
03.12.2009
Amendment
EVS-EN ISO 4287:1999/A1:2009
01.01.2000
Main
EVS-EN ISO 4287:1999
No scope available.

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Standards designation

EVS Estonian standard
EN European standard (published by an CEN or CENELEC)
EN ISO International standard adopted as an European standard
ISO International Organization for Standardization’s standard
IEC International Electrotechnical Commission’s standard
HD CENELEC’s harmonisation document
   
EVS-EN European standard implemented in Estonia
EVS-EN ISO International standard adopted in Europe and implemented in Estonia
EVS-EN ISO/IEC International standard/International electrotechnical standard adopted in Europe and implemented in Estonia
EVS-IEC International electrotechnical standard implemented in Estonia
EVS-ISO International standard implemented in Estonia
   
A, AMD amedment
+A a full standard plus the amendment
/A only amendment
COR, AC corrigendum
+COR a full standard plus the corrigendum
NA national annex
+NA a full standard plus the national annex
/NA only national annex
TS technical specification
TR technical report
CWA agreement, developed by a CEN or CENELEC
prEVS-EN (etc) draft standard
   
et the standard is in Estonian only
en the standard is in English only
et-en the standard is in Parallel text Estonian-English