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EVS-EN ISO 2178:1999

Non-magnetic coatings on magnetic substrates - Measurement of coating thickness - Magnetic method

General information

Withdrawn from 03.05.2016
Base Documents
ISO 2178:1982; EN ISO 2178:1995
ICS Groups
17.040.20 Properties of surfaces
Directives or regulations
None

Standard history

Status
Date
Type
Name
03.05.2016
Main
EVS-EN ISO 2178:2016
01.01.2000
Main
EVS-EN ISO 2178:1999
This second edition cancels and replaces the first edition (i. e. ISO 2178:1972). Specifies the method of using coating thickness instruments of the magnetic type for non-destructive measurements of the thickness. The method is applicable only for measurements on reasonably flat specimens. For non-magnetic substrates: see ISO 2361.

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English (PDF 201 KB)

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Standards designation

EVS Estonian standard
EN European standard (published by an CEN or CENELEC)
EN ISO International standard adopted as an European standard
ISO International Organization for Standardization’s standard
IEC International Electrotechnical Commission’s standard
HD CENELEC’s harmonisation document
   
EVS-EN European standard implemented in Estonia
EVS-EN ISO International standard adopted in Europe and implemented in Estonia
EVS-EN ISO/IEC International standard/International electrotechnical standard adopted in Europe and implemented in Estonia
EVS-IEC International electrotechnical standard implemented in Estonia
EVS-ISO International standard implemented in Estonia
   
A, AMD amedment
+A a full standard plus the amendment
/A only amendment
COR, AC corrigendum
+COR a full standard plus the corrigendum
NA national annex
+NA a full standard plus the national annex
/NA only national annex
TS technical specification
TR technical report
CWA agreement, developed by a CEN or CENELEC
prEVS-EN (etc) draft standard
   
et the standard is in Estonian only
en the standard is in English only
et-en the standard is in Parallel text Estonian-English