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EVS-EN ISO 11562:1999

Geometrical product specifications (GPS) - Surface texture: Profile method - Metrological characteristics of phase correct filters

General information

Withdrawn from 05.09.2012
Base Documents
ISO 11562:1996; EN ISO 11562:1997
Directives or regulations
None

Standard history

Status
Date
Type
Name
Describes the metrological characteristics of phase correct filters for the measurement of surface profiles. In particular it specifies how to separate the long and short wave content of a surface profile.

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