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EVS-EN 62047-3:2006

Semiconductor devices - Micro-electromechanical devices -- Part 3: Thin film standard test piece for tensile-testing

General information

Valid from 06.11.2006
Base Documents
IEC 62047-3:2006; EN 62047-3:2006
Directives or regulations
None

Standard history

Status
Date
Type
Name
06.11.2006
Main
This International Standard specifies a standard test piece, which is used to guarantee the propriety and accuracy of a tensile testing system for thin film materials with length and width under 1 mm and thickness under 10 μm, which are main structural materials for microelectromechanical systems (MEMS), micromachines and similar devices. This International Standard is based on such a concept that a tensile testing system can be guaranteed in propriety and accuracy, when the measured tensile strengths of the standard test pieces, whose tensile strength is pre-determined, are within the designated range. It also specifies the test pieces to minimize characteristics deviation among the pieces.

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