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EVS-EN 61000-4-20:2010

Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides

General information

Withdrawn from 18.04.2022
Base Documents
IEC 61000-4-20:2010; EN 61000-4-20:2010
Directives or regulations
None

Standard history

Status
Date
Type
Name
18.04.2022
Main
05.01.2011
Main
Main
EVS-EN 61000-4-20:2003
Amendment
EVS-EN 61000-4-20:2003/A1:2007
This part of IEC 61000 relates to emission and immunity test methods for electrical and electronic equipment using various types of transverse electromagnetic (TEM) waveguides. These types include open structures (for example, striplines and electromagnetic pulse simulators) and closed structures (for example, TEM cells). These structures can be further classified as one-, two-, or multi-port TEM waveguides. The frequency range depends on the specific testing requirements and the specific TEM waveguide type. The object of this standard is to describe - TEM waveguide characteristics, including typical frequency ranges and EUT-size limitations; - TEM waveguide validation methods for EMC tests; - the EUT (i.e. EUT cabinet and cabling) definition; - test set-ups, procedures, and requirements for radiated emission testing in TEM waveguides and - test set-ups, procedures, and requirements for radiated immunity testing in TEM waveguides.

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