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EVS-EN 60749:2002

Semiconductor devices - Mechanical and climatic test methods

General information

Withdrawn from 06.10.2003
Base Documents
IEC 60749:1996+A1:2000+A2:2001; EN 60749:1999+A1:2000+A2:2001
ICS Groups
31.080.01 Semiconductor devices in general
Directives or regulations
None

Standard history

Status
Date
Type
Name
07.11.2003
Main
EVS-EN 60749-1:2003
Main
EVS-EN 60749:2002
This International Standard lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. However, additional test methods may be required for non-cavity devices. This standard has taken into account, wherever possible, IEC 68. The object of this standard is to establish uniform preferred test methods with preferred values for stress levels for judging the environmental properties of semiconductor devices.

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Standard monitoring
English (PDF 2 MB)

Related products

Main

EVS-EN 60749-1:2003

Semiconductor devices - Mechanical and climatic test methods - Part 1: General
Newest version Valid from 07.11.2003
Main

EVS-EN IEC 60747-5-5:2020

Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers
Newest version Valid from 02.10.2020
Main

EVS-EN 60749-34:2010

Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
Newest version Valid from 05.01.2011
Main

EVS-EN IEC 60749-26:2018

Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
Newest version Valid from 02.04.2018

Standards designation

EVS Estonian standard
EN European standard (published by an CEN or CENELEC)
EN ISO International standard adopted as an European standard
ISO International Organization for Standardization’s standard
IEC International Electrotechnical Commission’s standard
HD CENELEC’s harmonisation document
   
EVS-EN European standard implemented in Estonia
EVS-EN ISO International standard adopted in Europe and implemented in Estonia
EVS-EN ISO/IEC International standard/International electrotechnical standard adopted in Europe and implemented in Estonia
EVS-IEC International electrotechnical standard implemented in Estonia
EVS-ISO International standard implemented in Estonia
   
A, AMD amedment
+A a full standard plus the amendment
/A only amendment
COR, AC corrigendum
+COR a full standard plus the corrigendum
NA national annex
+NA a full standard plus the national annex
/NA only national annex
TS technical specification
TR technical report
CWA agreement, developed by a CEN or CENELEC
prEVS-EN (etc) draft standard
   
et the standard is in Estonian only
en the standard is in English only
et-en the standard is in Parallel text Estonian-English