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EVS-EN 12543-4:2000

Non-destructive testing - Characteristics of focal spots in industrial X-ray systems for use in non-destructive testing - Part 4: Edge method

General information

Valid from 01.03.2000
Base Documents
EN 12543-4:1999
ICS Groups
19.100 Non-destructive testing
Directives or regulations
None

Standard history

Status
Date
Type
Name
01.03.2000
Main
EVS-EN 12543-4:2000
The image quality and the resolution of X-ray images depend highly on the characteristics of the focal spot. The imaging qualities of a focal spot are based on the twodimensional intensity distribution in the object
plane. This standard describes the measurement of focal spot dimensions above 0,3 mm of X-rays systems up to and including 500 kV, by means of radiographs of sharp edges.

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English (PDF 159 KB)

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Standards designation

EVS Estonian standard
EN European standard (published by an CEN or CENELEC)
EN ISO International standard adopted as an European standard
ISO International Organization for Standardization’s standard
IEC International Electrotechnical Commission’s standard
HD CENELEC’s harmonisation document
   
EVS-EN European standard implemented in Estonia
EVS-EN ISO International standard adopted in Europe and implemented in Estonia
EVS-EN ISO/IEC International standard/International electrotechnical standard adopted in Europe and implemented in Estonia
EVS-IEC International electrotechnical standard implemented in Estonia
EVS-ISO International standard implemented in Estonia
   
A, AMD amedment
+A a full standard plus the amendment
/A only amendment
COR, AC corrigendum
+COR a full standard plus the corrigendum
NA national annex
+NA a full standard plus the national annex
/NA only national annex
TS technical specification
TR technical report
CWA agreement, developed by a CEN or CENELEC
prEVS-EN (etc) draft standard
   
et the standard is in Estonian only
en the standard is in English only
et-en the standard is in Parallel text Estonian-English