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ISO 5861:2024
Surface chemical analysis — X-ray photoelectron spectroscopy — Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
Scope:
This document specifies a procedure by which the intensity scale of an X-ray photoelectron spectrometer that employs a concentric hemispherical analyser can be calibrated using low-density poly(ethylene). This document is applicable to instruments using quartz-crystal-monochromated Al Kα X-rays and is suitable for all instrument geometries. The intensity calibration is only valid for the specific settings of the instrument (pass energy or retardation ratio, lens mode, slit and aperture settings) used during the calibration procedure. The intensity calibration is applicable at kinetic energies higher than 180 eV. The intensity calibration is suitable for instruments that do not have an ion gun for the purpose of cleaning metal specimens in-situ (i.e. Au, Ag, Cu), or exhibit detector saturation when these specimens are measured using standard instrument parameters.
This document is not applicable to XPS instruments which do not have a system of charge compensation, or instruments that have a non-linear intensity response. This document is not applicable to instruments and operating modes which generate significant intensity from electrons scattered internally in the spectrometer (i.e. >1 % contribution of scattering intensity to the total spectral intensity).
This document is not applicable to XPS instruments which do not have a system of charge compensation, or instruments that have a non-linear intensity response. This document is not applicable to instruments and operating modes which generate significant intensity from electrons scattered internally in the spectrometer (i.e. >1 % contribution of scattering intensity to the total spectral intensity).
Base documents:
ISO 14594:2024
Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
Scope:
This document gives general guidelines for the determination of experimental parameters relating to the electron probe, the wavelength spectrometer, and the specimen that need to be taken into account when carrying out electron probe microanalysis. It also defines procedures for the determination of probe current, probe diameter, dead time, wavelength resolution, background, analysis area, analysis depth, and analysis volume.
This document is applicable for the analysis of a well-polished specimen using normal beam incidence.
This document does not apply to energy dispersive X-ray spectroscopy.
This document is applicable for the analysis of a well-polished specimen using normal beam incidence.
This document does not apply to energy dispersive X-ray spectroscopy.
Base documents:
Replaces:
ISO 14594:2014
EVS-EN 15119-2:2024
Durability of wood and wood-based products - Determination of emissions from preservative treated wood to the environment - Part 2: Wooden commodities exposed in Use Class 4 or 5 (in contact with the ground, fresh water or sea water) - Laboratory method
Scope:
This document specifies a laboratory method for obtaining water samples from treated wood which has been in conditions designed to simulate continuous contact with the ground or with water (use Class 4 or 5), at time intervals after exposure.
Base documents:
EN 15119-2:2024
Replaces:
CEN/TS 15119-2:2012
ISO 33403:2024
Reference materials — Requirements and recommendations for use
Scope:
This document describes good practice in using reference materials (RMs), and certified reference materials (CRMs) in particular, in measurement processes. These uses include:
— the assessment of precision and trueness of measurement methods;
— quality control;
— assigning values to materials;
— calibration;
— establishing conventional scales.
This document also relates key characteristics of various types of RMs to the different applications.
The preparation of RMs for calibration is also part of the scope of ISO 17034 and ISO 33405. The treatment in this document is limited to the fundamentals of small-scale preparation of RMs and the value assignment, as used by laboratories to calibrate their equipment. Larger scale production of such RMs, with the possible aim of distribution, is beyond the scope of this document. This type of activity is covered in ISO 17034 and ISO 33405.
— the assessment of precision and trueness of measurement methods;
— quality control;
— assigning values to materials;
— calibration;
— establishing conventional scales.
This document also relates key characteristics of various types of RMs to the different applications.
The preparation of RMs for calibration is also part of the scope of ISO 17034 and ISO 33405. The treatment in this document is limited to the fundamentals of small-scale preparation of RMs and the value assignment, as used by laboratories to calibrate their equipment. Larger scale production of such RMs, with the possible aim of distribution, is beyond the scope of this document. This type of activity is covered in ISO 17034 and ISO 33405.
Base documents:
Replaces:
ISO Guide 33:2015
Replaced standards
ISO 14594:2014
Microbeam analysis -- Electron probe microanalysis -- Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
Scope:
ISO 14594:2014 gives the general guidelines for the determination of experimental parameters relating to the primary beam, the wavelength spectrometer, and the sample that need to be taken into account when carrying out electron probe microanalysis. It also defines procedures for the determination of beam current, current density, dead time, wavelength resolution, background, analysis area, analysis depth, and analysis volume.
It is intended for the analysis of a well-polished sample using normal beam incidence, and the parameters obtained can only be indicative for other experimental conditions.
It is not designed to be used for energy dispersive X-ray spectroscopy.
It is intended for the analysis of a well-polished sample using normal beam incidence, and the parameters obtained can only be indicative for other experimental conditions.
It is not designed to be used for energy dispersive X-ray spectroscopy.
Base documents:
Replaced:
ISO 14594:2024
CEN/TS 15119-2:2012
Durability of wood and wood-based products - Determination of emissions from preservative treated wood to the environment - Part 2: Wooden commodities exposed in Use Class 4 or 5 (in contact with the ground, fresh water or sea water) - Laboratory method
Scope:
This Technical Specification specifies a laboratory method for obtaining water samples from treated wood which has been in conditions designated to simulate continuous contact with the ground or with water (use Class 4 or 5), at time intervals after exposure.
Base documents:
CEN/TS 15119-2:2012
Replaced:
EVS-EN 15119-2:2024
ISO Guide 33:2015
Reference materials -- Good practice in using reference materials
Scope:
ISO Guide 33:2015 describes good practice in using reference materials (RMs), and certified reference materials (CRMs) in particular, in measurement processes. These uses include the assessment of precision and trueness of measurement methods, quality control, assigning values to materials, calibration, and the establishment of conventional scales. This Guide also relates key characteristics of various types of RMs to the different applications.
For CRMs, the metrological traceability of the property values to international scales or other measurement standards has been established. For RMs not being CRMs, this kind of traceability of property values has often not been established. Nevertheless, these RMs can still be used for assessing parts of measurement procedures, including evaluating various levels of precision
Mainstream applications of RM include precision control, bias assessment, calibration, preparation of calibration RMs and maintaining conventional scales.
NOTE Not all types of RMs can be used for all indicated purposes.
The preparation of RMs for calibration is also part of the scope of ISO Guides 34 and 35. The treatment in this Guide is limited to the fundamentals of small-scale preparation of RMs and the value assignment, as used by laboratories to calibrate their equipment. Larger scale production of such RMs, with the possible aim of distribution is beyond the scope of this Guide. This type of activity is covered in ISO Guides 34 and 35.
The development of working standards, as used in, e.g. natural gas analysis, clinical chemistry, and the pharmaceutical industry is not covered in this Guide. This type of activity is covered in ISO Guides 34 and 35.
For CRMs, the metrological traceability of the property values to international scales or other measurement standards has been established. For RMs not being CRMs, this kind of traceability of property values has often not been established. Nevertheless, these RMs can still be used for assessing parts of measurement procedures, including evaluating various levels of precision
Mainstream applications of RM include precision control, bias assessment, calibration, preparation of calibration RMs and maintaining conventional scales.
NOTE Not all types of RMs can be used for all indicated purposes.
The preparation of RMs for calibration is also part of the scope of ISO Guides 34 and 35. The treatment in this Guide is limited to the fundamentals of small-scale preparation of RMs and the value assignment, as used by laboratories to calibrate their equipment. Larger scale production of such RMs, with the possible aim of distribution is beyond the scope of this Guide. This type of activity is covered in ISO Guides 34 and 35.
The development of working standards, as used in, e.g. natural gas analysis, clinical chemistry, and the pharmaceutical industry is not covered in this Guide. This type of activity is covered in ISO Guides 34 and 35.
Base documents:
Replaced:
ISO 33403:2024